Article 7116

Title of the article

A REVIEW OF ACOUSTIC EMISSION APPLICATION FOR MICRO- AND NANODEFECTS DETECTION 

Authors

Shayko-Shaykovskiy Aleksandr Grigor'evich, doctor of technical sciences, professor, sub-department of professional and technological education and general physics, Chernovitsky National University named after Yuriy Fed'kovich (58012, 2 Kotsyubinskogo street, Chernovtsy, Ukraine), shayko@bk.ru
Bogorosh Aleksandr Terent'evich, doctor of technical sciences, professor, sub-department of applied physics, Kiev Polytechnic Institute, National Technical University of Ukraine (03056, 37 Pobedy avenue, Kiev, Ukraine)
Voronov Sergey Aleksandrovich, doctor of technical sciences, professor, head of sub-department of applied physics, Kiev Polytechnic Institute, National Technical University of Ukraine (03056, 37 Pobedy avenue, Kiev, Ukraine)
Marchenko Ekaterina Valerievna, postgraduate student, Kiev Polytechnic Institute, National Technical University of Ukraine (03056, 37 Pobedy avenue, Kiev, Ukraine)

Index UDK

621.315.612

Abstract

Acoustic emission (AE) is a phenomenon of generation of stress waves caused by a sudden rearrangement of the structure of the material. Classical sources AE deformation process is associated with an increase in defects such as cracks or plastic deformation zone. The paper discusses the generation and detection of acoustic emission, including a sudden movement of the source of emission, which causes the appearance of stress waves that propagate in the structure of the material and reach the sensor in the form of piezoelectric transducers As the stress activated many of the existing objects in the material emission sources and electrical AE obtained from the transformation of stress waves, amplify, recording equipment and are subjected to further processing and interpretation. Overview of AE considered for some cases in practice, including pressure vessels, pipelines, aircraft structural assemblies, operating under the influence of vibration, temperature changes, metal welding. Much attention is paid to the composition and semiconductor materials and heterostructures.

Key words

acoustic emission, detection of nanoand micro-defects in various designs.

Download PDF

 

Дата создания: 18.05.2016 11:17
Дата обновления: 19.05.2016 10:18